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Quality and Reliability Handbook

Semiconductors

• Review of Quality and Reliability Handbook ( 6MB)

Opto/RF&Microwave devices

Title Document No. Date Size Review of Quality and Reliability Handbook PQ10478EJ02V0TN 2006/06 4,591KB 　Chapter 1 Quality Assurance System PQ10478EJ02V0TN 2006/06 514KB 　Chapter 2 Reliability of Semiconductors PQ10478EJ02V0TN 2006/06 129KB 　Chapter 3 Failure Modes And Mechanisms PQ10478EJ02V0TN 2006/06 1,019KB 　Chapter 4 Failure Analysis PQ10478EJ02V0TN 2006/06 2,228KB 　Chapter 5 Design Simplification and Reliability Analysis Methods PQ10478EJ02V0TN 2006/06 126KB 　Chapter 6 Use of Semiconductor Devices PQ10478EJ02V0TN 2006/06 329KB 　Appendix PQ10478EJ02V0TN 2006/06 333KB

Quality and Reliability

• Quality system certification (ISO)
• Documents
  • Quality and Reliability Handbook
  • Quality Grades on NEC Semiconductor Devices (40KB)
  • General of Bare-die Quality Assurance (Japanese-only) (62KB)
  • Guide to Prevent Damage for Semiconductor Devices by Electrostatic Discharge (ESD) (193KB)
  • Semiconductor Failure Rate Information (515KB)
  • Quality and Reliability Handbook
  • Quality Grades on NEC Semiconductor Devices (40KB)
  • General of Bare-die Quality Assurance (Japanese-only) (62KB)
  • Guide to Prevent Damage for Semiconductor Devices by Electrostatic Discharge (ESD) (193KB)
  • Semiconductor Failure Rate Information (515KB)
• FAQ (Reliability)
• Quality/Reliability Terms