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CHAPTER 3 SOLDERING CONDITIONS


3.2 Heat Resistance
3.2.3 Causes of Package Crack Occurrence

(a) Moisture absorption of package before soldering

Figure 3-2-6 shows the influences of the moisture absorption of the package on the SMD before the device is soldered and mounted.
This figure illustrates the relationship between the threshold moisture absorption rate and time when thermal stress of infrared reflow soldering is imposed on the sample.

パッケージクラック発生と吸湿率の関係グラフ(5.53KB)

The threshold moisture absorption rate, beyond which the package is cracked, is 0.18% when the sample is stored at 85°C, 85%RH for 14 hours, and 0.125% when the sample is stored at 30°C, 70%RH for 192 hours.

  Figure 3-2-6. Relations Between Occurrence of Package Crack
and Moisture Absorption Rate

  < Moisture concentration characteristics >

Figure 3-2-7 shows a moisture concentration model in the package when a crack occurs. The moisture concentrations on the rear surface of the island (metal plate on which the chip is placed) coincide when the crack has occurred.

Therefore, it can be concluded that the package crack is dependent upon the moisture concentration on the rear surface of the island, not upon the moisture absorption rate.

水分濃度モデルのグラフおよび図(6.48KB)
   

Figure 3-2-7. Moisture Concentration Characteristics

To 3.2.3 Causes of Package Crack OccurrenceTo 3.2.3(b) Package structure effect