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| Document Name | Corresponding Part Numbers | Size |
|---|---|---|
| GaAs Devices Selection Guide | uPG*, NE3*, NE4*, NE65*, MC-*, etc. | 223KB |
| Silicon Microwave Semiconductors Selection Guide | uPA*, uPB*, uPC*, uPD*, 2SC*, NESG*, etc. | 585KB |
| RF and Microwave Devices Selection Guide -Application System- |
All RF and Microwave Device Products | 446KB |
| Document Name | Corresponding Part Numbers | Size |
|---|---|---|
| RELIABILITY QUALITY CONTROL OF MICROWAVE MINIMOLD TRANSISTORS | 2SC*, NESG* | 55KB |
| RELIABILITY QUALITY CONTROL OF CATV MODULE | MC-78* | 48KB |
| RELIABILITY QUALITY CONTROL OF PA MCM FOR MOBILE PHONES | - | 48KB |
| RELIABILITY QUALITY CONTROL OF POWER GaAs FET DEVICE | NE65*, NES1* | 61KB |
| RELIABILITY QUALITY CONTROL OF LOW NOISE GaAs FET DEVICE | NE3*, NE4* | 67KB |
| RELIABILITY QUALITY CONTROL OF SILICON POWER FET DEVICE | NE55*, NEM* | 66KB |
| RELIABILITY QUALITY CONTROL OF GaAs MMIC | uPG* | 52KB |
| RELIABILITY QUALITY CONTROL OF SILICON MMIC | uPB*, uPC* | 51KB |
| Optical/Microwave Semiconductor Devices Review of Quality and Reliability Handbook | - | 4591KB |
The titles of the application documents include the target part numbers.