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Volume 72 (Oct 29, 2007)
Summary of NEC Electronics Papers Presented at the 2007 EOS/ESD Symposium (1/3)
The ESD Association's annual "2007 EOS/ESD Symposium," a premier international event focused on electrical overstress and electrostatic discharge failures and solutions in electronic devices and parts, was held in Anaheim, California, USA, from September 16—21. Here we will briefly introduce the research findings presented by NEC Electronics engineers at this year's EOS/ESD Symposium.
EOS/ESD Symposium Overview
First organized in 1979, the EOS/ESD Symposium marked its 29th anniversary this year and featured 12 technical sessions covering materials, different environments, and ESD case studies. This annual international event serves as technical forum for engineers from different companies, including NEC Electronics Corporation, to present their latest research and development findings on ESD phenomena and ESD control techniques. Two papers by NEC Electronics authors were presented at this year's symposium.
Papers Presented by NEC Electronics
<<Paper Titles>>
- Technical Session 1A.5
- Layout Technique to Alleviate Soft Failure for Short-Pitch Multi-Finger ESD Protection Devices
- A high-performance, low-cost MOS-type electrostatic discharge (ESD) protection device has been developed featuring two layout modifications that significantly reduce soft failures—a short-pitch multi-finger layout using a contact ballast resistor and a heat dissipation path.
- Technical Session 7A.1
- A Low-Leakage SCR Design Using Trigger-PMOS Modulations for ESD Protection
- We have developed a thyristor silicon-controlled rectifier (SCR)-type electrostatic discharge (ESD) protection circuit that combines low leakage current with low trigger voltage. Incorporating a P-channel MOSFET in the trigger element, the circuit can be adapted to a wide range of applications by modifying the structure of the PMOS logic.
395KB)Links
- Press Release
- NEC Electronics Announces On-chip ESD Protection for the 45-nm Node: Innovative ESD Circuit Structure Enables More Reliable SoC Devices
- NEC Electronics Introduces On-chip ESD Protection for 45-nm High-speed Communications ICs: SCR-type ESD Protection Circuit Achieves Low Trigger Voltage with Low Leakage Current
