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Example 8 : EMI Noise Reduction Measures(EA-9HD)


With the EA-9HD, the EMI noise of a customer's set can be largely reduced through three measures: a "mounting of capacitive cell macro", a "mounting of SSCG macro", and an "isolated power supply". Also, by providing a high-precision EMI simulation environment, noise reduction effects can be accurately estimated in advance.



Mounting of Capacitive Cell Macro - Reduction of Internal Circuitry's Clock Noise

Mounting of Capacitive Cell Macro - Reduction of Internal Circuitry's Clock Noise


Isolated Power Supply - Blocking of Internal Circuit Noise

Isolated Power Supply - Blocking of Internal Circuit Noise


Mounting of SSCG Macro - Lowering of EMI Peak Values

Mounting of SSCG Macro - Lowering of EMI Peak Values


EMI Effect Examples

It varies depending on the operating frequency, the frequency band, the logic scale, the quantity of mounted capacitive cell macros, and so on, but maximum noise reduction effects of -30 dB or more can be expected.


Mounted Set Master Operating Frequency
(MHz)
Measured Noise Frequency
(MHz)
Noise Reduction Effect
(dBμA)
(EMI Simulation)
A μPD65473 50 200 -36.7
B μPD65422 8 176 -32
C μPD65444 60 360 -21.5
D μPD65452 50 100 -20.9
E μPD65449 66 132 -17.6
F μPD65476 48 96 -15.9
G μPD65443 50 100 -13.2
H μPD65474 40 80 -13.1
I μPD65446 40 80 -12.1
J μPD65443 50 100 -11.7
K μPD65445 40 80 -11.3
L μPD65474 40 80 -11.2



Realization of High Precision Simulations

NEC Electronics provides an EMI simulation environment that yields highly precise values which differ only slightly from measured values. This enables customers to reliably estimate the effectiveness of noise reduction measures before committing them to actual chips. Consequently, customers are able to shorten their turnaround time of system development and reduce the number of anti-noise components mounted after set assembly.


Realization of high precision simulations

Circuit Degeneracy by ApsimLPG

Circuit degradation by ApsimLPG

Comparison of Measured and Simulated Values

Comparison of measured and simulated values





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